Fig. 7From: Environment-Adaptable Fast Multi-Resolution (EAF-MR) optimization in large-scale RF-FPGA systemsSimulation results for RF impairment estimation using the design of experiments (DoE) method. a Estimated gain \(\hat {\mathbf {Y}}\) of configurations in a sample configuration set. b Estimated \(\text {IIP}_{3}\, \hat {\mathbf {Y}}\) of configurations in a sample configuration set. c Estimated gain \(\hat {\theta }\) of each amplifier. d Estimated \(\text {IIP}_{3}\, \hat {\theta }\) of each amplifier. e Estimated gain \(\hat {\mathbf {Z}}\) of configurations in a screening design set. f Estimated \(\text {IIP}_{3}\, \hat {\mathbf {Z}}\) of configurations in a screening design setBack to article page