Table 8 The results of the methods
From: Electromagnetic radiation-based IC device identification and verification using deep learning
Method | SVM | Logistic regression | This paper |
|---|---|---|---|
Accuracy | 63% | 61.3% | 99.63% |
From: Electromagnetic radiation-based IC device identification and verification using deep learning
Method | SVM | Logistic regression | This paper |
|---|---|---|---|
Accuracy | 63% | 61.3% | 99.63% |