Editorial Board

Editor-in-Chief

Prof. Dr.-Ing. Eduard Jorswieck
Univ.-Professor für Theoretische Nachrichtentechnik  
Technische Universität Dresden
Fakultät für Elektrotechnik und Informationstechnik 
Institut für Nachrichtentechnik
01062 Dresden
E-Mail: Eduard.Jorswieck@tu-dresden.de

Associate Editors

Farid Ahmed, Johns Hopkins University Applied Physics Laboratory, USA
Giusi Alfano, DISAT Politecnico di Torino, Italy
Carles Antón-Haro, Telecommunications Technological Center of Catalonia (CTTC), Spain
Kamran Arshad, Ajman University, UAE
Yong Bai, Hainan University, China
Marco Baldi, Università Politecnica delle Marche, Italy
Vo Nguyen Quoc Bao, PTIT Posts and Telecommunications Institute of Technology, Vietnam
Pan Cao, The University of Edinburgh, United Kingdom
Marco Cattani, TU Graz, Austria
Anas Chaaban, King Abdullah University of Science and Technology (KAUST), Kingdom of Saudi Arabia
Yuh Shyan Chen, National Taipei University, Taiwan
Pascal Chevalier, Thalès-Communications, France
Spyridon K. Chronopoulos, University of Ioannina, Greece
Daniel Benevides da Costa, Federal University of Ceara , Brazil
Rodrigo C. De Lamare, The University of York, United Kingdom
Ibrahim Develi, Erciyes University, Turkey
Qian Gao, University of Science and Technology of China, China
Michael Gastpar, University of California at Berkeley, USA
Zabih F. Ghassemlooy, Northumbria University, United Kingdom
Filippo Giannetti, Università di Pisa, Italy
Anastasios Giovanidis, Marie Curie University, France
Jean-marie Gorce, Institut National des Sciences Appliquées de Lyon, France
Fabrizio Granelli, Università degli Studi di Trento, Italy
Shengqian Han, Beihang University, China 
Yongming Huang, Southeast University, China
Mingye Ji, University of Utah, USA
David Jonietz, ETH Zürich, Switzerland
Hamdi Joudeh, Imperial College London, UK
Muhammad Ruhul Amin Khandaker, University College London (UCL), United Kingdom 
Thomas D. Lagkas, The University of Sheffield, Greece
Vincent Lau, Hong Kong University of Science and Technology, Hong Kong
Tho Le-Ngoc, McGill University, Canada
Yong Li, Tsinghua University, China
Lingjia Liu, Dallas Telecomm. R&D Center, Samsung Electronics, USA
Daniel Lucani, Aalborg University, Denmark
Nicola Marchetti, Trinity College Dublin, Ireland
Roman Maršálek, Brno University of Technology, Czech Republic
Rami Mochaourab, KTH Royal Institute of Technology, Sweden
Youssef Nasser, American University of Beirut, Lebanon
Ngoc Tu Nguyen, Missouri University of Science and Technology, USA
Claude Oestges, Université catholique de Louvain, Belgium
Giovanni Pau, Kore University, Italy
Jordi Pérez-Romero, Universitat Politècnica de Catalunya (UPC), Spain
Bhaskar Prasad Rimal, The University of New Mexico, USA
Stefan Schwarz, Technische Universität Wien, Austria
Richard Demo Souza, Department of Electrical Engineering, Federal University of Technology - Florianopolis, SC, Brazil
Hongjian Sun, Durham University, UK
Zhi Sun, University of Buffalo, USA
Jie Tang, South China University of Technology, China
Stefano Tomasin, University of Padova, Italy
Le-Nam Tran, Maynooth University, Ireland 
Kwan L. Yeung, The University of Hong Kong, Hong Kong
Heng Zhang, Western Sydney University, Australia
Qi Zhang, Department of Engineering, Aarhus University, Denmark